A Practical Guide to Total Reflection X-ray Fluorescence discusses how a wide range of samples can be analyzed using Total Reflection X-ray Fluorescence (TXRF) to obtain meaningful and accurate results. Sample handling is a complex problem and often very targeted approaches are needed. The strengths and weaknesses of the method are discussed in the context of each application in this book. This includes guidelines and suggestions of how to treat and analyze different samples and how to evaluate the data. In addition to sample handling, users of TXRF will learn how to use and calibrate the instrumentation, what specific features are present and which experimental parameters need to be considered, and how to evaluate the data.The book is divided into two parts. with the first part describing the theoretical aspects of the method and the second part being solely dedicated to its applications. The book emphasizes a practical approach to the method, including advantages and also limitations.

The primary concept throughout the book is the chemical measurement process and how it applies to TXRF analysis. The concept is introduced in the first part of the book describing its main aspects like samples, sample handling, and quantification. In the second part of the book the topic is applied to the different application fields of TXRF, presented as separated chapters. Key case studies emphasizing the strength of the method are included in each of the chapters. The book also explains in detail the calibration of the instrument and method, experimental parameters to apply, quantification procedures, and spectra evaluation.This book serves as a valuable resource for users and users-to-be in the field of elemental and trace analysis. All co-authors offer extensive experience in the field of TXRF and can guide users through the chemical measurement process of a specific field of application including what elements are most suitable, and what issues may occur.