Basic Concepts of X-Ray Diffraction
Basic Concepts of X-Ray Diffraction
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Author(s): Zolotoyabko
Zolotoyabko, Emil
ISBN No.: 9783527335619
Pages: 312
Year: 201404
Format: Trade Paper
Price: $ 139.31
Dispatch delay: Dispatched between 7 to 15 days
Status: Available

Preface Introduction DIFFRACTION PHENOMENA IN OPTICS WAVE PROPAGATION IN PERIODIC MEDIA DYNAMICAL DIFFRACTION OF PARTICLES AND FIELDS: GENERAL CONSIDERATIONS The Two-Beam Approximation Diffraction Profile: The Laue Scattering Geometry Diffraction Profile: The Bragg Scattering Geometry DYNAMICAL X-RAY DIFFRACTION: THE EWALD-LAUE APPROACH Dynamical X-Ray Diffraction: Two-Beam Approximation DYNAMICAL DIFFRACTION: THE DARWIN APPROACH Scattering by a Single Electron Atomic Scattering Factor Structure Factor Scattering Amplitude from an Individual Atomic Plane Diffraction Intensity inthe Bragg Scattering Geometry DYNAMICAL DIFFRACTION IN NONHOMOGENEOUS MEDIA. THE TAKAGI-TAUPIN APPROACH Takagi Equations Taupin Equation X-RAY ABSORPTION DYNAMICAL DIFFRACTION IN SINGLE-SCATTERING APPROXIMATION: SIMULATION OF HIGH-RESOLUTION X-RAY DIFFRACTION IN HETEROSTRUCTURES AND MULTILAYERS Direct Wave Summation Method RECIPROCAL SPACE MAPPING AND STRAIN MEASUREMENTS IN HETEROSTRUCTURES X-RAY DIFFRACTION IN KINEMATIC APPROXIMATION X-Ray Polarization Factor Debye-Waller Factor X-RAY DIFFRACTION FROM POLYCRYSTALLINE MATERIALS Ideal Mosaic Crystal Powder Diffraction APPLICATIONS TO MATERIALS SCIENCE: STRUCTURE ANALYSIS APPLICATIONS TO MATERIALS SCIENCE: PHASE ANALYSIS Internal Standard Method Rietveld Refinement APPLICATIONS TO MATERIALS SCIENCE: PREFERRED ORIENTATION (TEXTURE) ANALYSIS The March-Dollase Approach APPLICATIONS TO MATERIALS SCIENCE: LINE BROADENING ANALYSIS Line Broadening due to Finite Crystallite Size Line Broadening due to Microstrain Fluctuations Williamson-Hall Method The Convolution Approach Instrumental Broadening Relation between Grain Size-Induced and Microstrain-Induced Broadenings of X-Ray Diffraction Profiles APPLICATIONS TO MATERIALS SCIENCE: RESIDUAL STRAIN/STRESS MEASUREMENTS Strain Measurements in Single-Crystalline Systems Residual Stress Measurements in Polycrystalline Materials IMPACT OF LATTICE DEFECTS ON X-RAY DIFFRACTION X-RAY DIFFRACTION MEASUREMENTS IN POLYCRYSTALS WITH HIGH SPATIAL RESOLUTION The Theory of Energy-Variable Diffraction (EVD) INELASTIC SCATTERING Inelastic Neutron Scattering Inelastic X-Ray Scattering INTERACTION OF X-RAYS WITH ACOUSTIC WAVES Thermal Diffuse Scattering Coherent Scattering by Externally Excited Phonons TIME-RESOLVED X-RAY DIFFRACTION X-RAY SOURCES Synchrotron Radiation X-RAY FOCUSING OPTICS X-Ray Focusing: Geometrical Optics Approach X-Ray Focusing: Diffraction Optics Approach X-RAY DIFFRACTOMETERS High-Resolution Diffractometers Powder Diffractometers Index.


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