Fringe 2009 : 6th International Workshop on Advanced Optical Metrology
Fringe 2009 : 6th International Workshop on Advanced Optical Metrology
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ISBN No.: 9783642030505
Pages: xxiv, 792
Year: 200909
Format: Mixed Media
Price: $ 455.39
Dispatch delay: Dispatched between 7 to 15 days
Status: Available

Key Note.- Holography in the '60s and '70s – A View from the Fringes.- Topic 1: New Methods and Tools for Data Acquisition.- Coherence Holography: A Thought on Synthesis and Analysis of Optical Coherence Fields.- The Polarization Approach in Measuring Correlation Properties of Optical Fields.- Real-time Coherence Holography.- Coherence and Correlation in Digital Holography.- Analysis of fringe formation and localization in optical interferometry using optical coherence.


- Quantitative Phase Imaging in Microscopy.- Comparison and unification of speckle-based phase retrieval and holography with applications in phasefront alignment and recognition.- High Precision Object Phase Reconstruction with Modified Phase Retrieval.- Phase retrieval with an LCoS display: characterization and application.- Digital dynamic-fringe pattern processing without frequency carrier, using wideband phase-shifting algorithmsM.- Error-compensating phase-shifting Fizeau interferometry with a wavelength-tunable laser diode.- Lateral Shearing Interferometer based on a Spatial Light Modulator in the Fourier Plane.- Digital phase shifting holography and holographic interferometry.


- Fourier-transform method with high accuracy by use of iterative technique narrowing the spectra of a fringe pattern.- Fringe pattern processing using a new adaptive and steereable asynchronous algorithm.- Synthetic Aperture Digital Holography.- A new application of the Delaunay triangulation: The processing of speckle interferometry signals.- Phase analysis of interference signal with optical Hilbert transform based on orthogonal linear polarization phase shifting.- Digital Fourier-transform processing for analysis of speckle photographs.- Wavefront evaluation in phase shifting interferometry based on recurrence fringe processing with 3D prediction.- White-light fringe analysis with low-cost CCD camera.


- Design and assessment of Differential Phase-Shifting Algorithms by means of their Fourier representation.- A Nonlinear Technique for Automatic Twin-Image and Zero-Order Term Suppression in Digital Holographic Microscopy.- Modified two-step phase-shifting algorithm: analysis, demonstration, and application.- The Used of Reference Wave for Diagnostics of Phase Singularities.- New convolution algorithms for reconstructing extended objects encoded in digitally recorded holograms.- Reconstruction of noisy measured sharp edges at thin sheet metal components.- Reduction of speckles in digital holographic interferometry.- Normalization and denoising in a multi-source and multi-camera profilometric system.


- Automated Phase Map Referencing Against Historic Phase Map Data.- Numerical multiplexing and de-multiplexing techniques for efficient storage and transmission of digital holographic information.- Fringe Pattern Normalization Using Bidimensional Empirical Mode Decomposition and the Hilbert Transform.- Complementary Filtering Approach to Enhance the Optical Reconstruction of Holograms from a Spatial Light Modulator.- Combination of Phase Stepping and Fringe Tracking to Evaluate Strain from Noisy DSPI Data.- Influence of filter operators on 3D coordinate calculation in fringe projection systems.- Polarization interferometry of singular structure of organic crystal polarization properties.- Zero order interferometry technique for measuring the Lyapunov’s maximal index in optical fields.


- Orientation-selective spiral-phase contrast microscopy.- Topic 2: Application Enhanced Technologies.- Model-based white light interference microscopy for metrology of transparent film stacks and optically-unresolved structures.- Limitations and Optimization of Low-coherence Interferometry for High Precision Microscopic Form Measurement.- Instantaneous Wavelength Detection by a Whole-Field k-space Method.- Limiting aspects in length measurements by interferometry.- Aspects of design and the characterization of a high resolution heterodyne displacement interferometer.- The femtosecond optical synthesizer as a tool for determination of the refractive index of air in ultra-precise measurement of lengths.


- Digital holographic microscopy with a simultaneous phase-shifting interferometer for measuring the angular spectrum generated by micro-optical structures.- Resolution enhancement in digital holography by a two-dimensional electro-optically tunable phase grating.- Resolution improvement in lensless digital holographic interferometry.- Digital holography catching up with analogue holography both in resolution and in field of view with a bottom-line camera.- Fresnel and Fourier digital holography architectures: a comparison.- The last Word on Three-Flat Calibration − are we there yet?.- A New Flatness Reference Measurement System Based on Deflectometry and Difference Deflectometry.- Quasi absolute Test for Aspherics via dual Wavefront Holograms and a radial ShearPosition.


- Rapid and flexible measurement of precision aspheres.- Measurement of the shape of objects by the interferometry with two wavelengths.- Recording-plane division multiplexing (RDM) in pulsed digital holography for optical metrology.- Identification of deformation components in TV holography and digital holography.- Extending the capabilities of the sphere interferometer of PTB by a stitching procedure.- Fringe contrast improving in low coherence interferometry by white light emitting diodes spectrum shaping.- Absolute testing of aspherics in transmitted light using an amplitude DOE.- MEMS Calibration Standards for the Optical Measurement of Displacements.


- About the feasibility of nearfield-farfield transformers based on optical metamaterials.- Analogy of white-light interferometry and pulse shaping.- Topic 3: 4D Optical Metrology over a Large Scale.- Nanomeasuring and Nanopositioning Engineering.- Reconstruction of Shape using Gradient Measuring Optical Systems.- Metrological SPM with positioning controlled by green light interferometry.- Measuring Shape and Surfaces down to the Nanometer and Nanosecond scales by Digital Holographic Microscopy.- Deflectometry: 3D-Metrology from Nanometer to Meter.


- 3-D Sensing for Microstructures Using Dynamic DOEs.- Doppler phase-shift fringe analysis and digital holography using high-speed digital camera.- Shape and Deformation Measurement of Moving Object by Sampling Moiré Method.- New Interferometry Tools for AeroOptics.- Dynamic Fizeau Interferometers.- Surface contouring of vibrating objects using quadrature transform.- Development and Application of a 10 Hz Nd:YAG Double Pulse Laser for Vibration Measurements with Double Pulse ESPI.- Combining novel fringe analysis and photogrammetry for industrial shape measurement.


- Digital holographic interferometry for deformation measurement by means of an acoustical device.- Pump-probe interference microscope observation for femtosecond-laser induced phenomena.- Three-dimensional shape measurement of dynamic objects with spatially isolated surfaces.- Optical design of a DOE-based laser interferometer for inspection of MEMS/MOEMS.- Time Resolved High Resolution Shape and Colour Measurement using Fringe Projection.- Dynamic 3-D shape measurement techniques with marked fringes tracking.- Optical measurement and color map projection system to highlight geometrical features on free form surfaces.- Digital holographic recording of large scale objects for metrology and display.


- Multiwavelength laser interferometry.- Accurate and fast three-dimensional imaging with use of fringe projection profilometry.- 3D vibration analysis of granular materials with two-color digital Fresnel holography.- System for transient spatio-temporal (4D) vibration imaging and non-destructive inspection.- Microelements vibration measurement using quasi-heterodyning method and smart-pixel camera.- Dynamic multipoint vibrometry using spatial light modulators.- Topic 4: Hybrid Measurement Techniques.- Optoelectronic method for device characterization and experimental validation of operational performance.


- Computational inverse holographic imaging: toward perfect reconstruction of wavefield distributions.- Cooperative Sensor Approach for holistic geometrical Measurement Tasks on Cutting Tools.- View Planning for 3D Reconstruction using Time-of-Flight Camera Data as a-priori Information.- Stereo vision based approach for extracting features from digital holograms.- Flexible Combination of Optical Metrology Strategies for the Automated Assembly of Solid State Lasers.- A Numerical Simulation Benchmark of Tilt Scanning Interferometry for 3D Metrology.- A virtual telecentric fringe projection system.- Inspection of an extended surface by an active 3D multiresolution technique.


- Automated Multiscale Measurement System for micro optical elements.- Simulation based sensitivity analysis and optimization of Scatterometry measurements for future semiconductor technology nodes.- Electronic Speckle Pattern Interferometry at Long Infrared Wavelengths. Scattering Requirements.- Topic 5: New Optical Sensors and Measurement.- Novel interferometric measurement systems for the characterization of micro-optics.- Design of a micro-optical low coherent interferometer array for the characterisation of MEMS and MOEMS.- Looking for a new generation of MEMS-type confocal microscopes.


- Radial in-plane achromatic digital speckle pattern interferometer using an axis-symmetrical diffractive optical element.- Wavefront Sensor Design based on a Micro-Mirror Array for a High Dynamic Range Measurement at a High Lateral Resolution.- Intellectual property in industry and academia: where interests merge?.- Moiré interferometer for surface mapping with liquid crystal grids.- High resolution tilt scanning interferometry system for full sensitivity depth-resolved displacement measurements in weakly scattering materials.- Multifunctional phase-stepping interferometer for measurement in real time.- A Wonderful World of Holography, Interferometry, and Optical Testing.- Multi.



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