Optical Measurement Systems for Industrial Inspection V : 18-22 June 2007, Munich, Germany
Optical Measurement Systems for Industrial Inspection V : 18-22 June 2007, Munich, Germany
Click to enlarge
Author(s): Novak, Erik
Osten, Wolfgang
ISBN No.: 9780819467584
Pages: 1,338
Year: 200706
Format: Other
Price: $ 333.85
Dispatch delay: Dispatched between 7 to 15 days
Status: Available

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.


To be able to view the table of contents for this publication then please subscribe by clicking the button below...
To be able to view the full description for this publication then please subscribe by clicking the button below...