Optical Inspection and Metrology for Non-Optics Industries : 3-4 August 2009, San Diego, California, United States
Optical Inspection and Metrology for Non-Optics Industries : 3-4 August 2009, San Diego, California, United States
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Author(s): Huang, Peisen S.
ISBN No.: 9780819477224
Pages: 378
Year: 200909
Format: Trade Paper
Price: $ 135.21
Dispatch delay: Dispatched between 7 to 15 days
Status: Available

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.


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