Two- And Three-Dimensional Methods for Inspection and Metrology VI : 10-11 August 2008, San Diego, California, USA

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ISBN No.:	9780819472861
Pages:	178
Year:	200808
Format:	Trade Paper
Price:	$ 110.40
Dispatch delay:	Dispatched between 7 to 15 days
Status:	Available

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Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

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