Dimensional Optical Metrology and Inspection for Practical Applications
Dimensional Optical Metrology and Inspection for Practical Applications
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Author(s): Harding, Kevin
Yoshizawa, Toru
ISBN No.: 9780819487438
Pages: 304
Year: 201108
Format: Trade Paper
Price: $ 124.20
Dispatch delay: Dispatched between 7 to 15 days
Status: Available

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.


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