Next Generation Technology-Enhanced Assessment : Global Perspectives on Occupational and Workplace TestingGlobal Perspectives on Occupational and Workplace Testing
Next Generation Technology-Enhanced Assessment : Global Perspectives on Occupational and Workplace TestingGlobal Perspectives on Occupational and Workplace Testing
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Author(s): Bartram, Dave
Foster, David
Reynolds, Douglas H.
Scott, John
ISBN No.: 9781107561533
Pages: 421
Year: 202006
Format: Trade Paper
Price: $ 65.94
Dispatch delay: Dispatched between 7 to 15 days
Status: Available

Part I. Common Assessment Methods Deployed with Internet Technology: 1. Employment testing Seymour Adler, Anthony Boyce and Pat Caputo; 2. Licensing and certification John Weiner and David Foster; Part II. Technical Foundations for Internet-based Assessment Delivery: 3. Infrastructure to support technology-enhanced global assessment John Weiner and Ian Necus; 4. Software design, development, and implementation for technology-enhanced assessments Tami Licht and Emily Stehura; Part III. Advances, Trends and Issues: 5.


Changing relationships within the testing ecosystem Dragos Iliescu; 6. Security of technology-enhanced assessments David Foster and Steve Addicott; 7. The changing landscape of technology-enhanced test administration Tracy Kantrowitz and Sara L. Gutierrez; 8. Use of social network data for assessment Mike Zickar; 9. Technology-driven developments in psychometrics Fritz Drasgow and Julie Olson-Buchanan; 10. Integration with applicant tracking and management systems Rich Cober and Steve Hall; 11. The gamification of employee selection tools: an exploration of viability, utility and future directions Ben Hawkes, Iva Cek and Charles Handler; Part IV: Guidelines for Practice and Future Directions: 12.


Standards and best practices for technology-enhanced assessments Iain Coyne and Dave Bartram; 13. Ethical and legal concerns in technology-enhanced testing Rodney Lowman; 14. Conclusion - recurring themes in the application of technology-enhanced assessment Doug H. Reynolds, John C. Scott and David Bartram.


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