Semiconductor Interfaces, Microstructures and Devices : Properties and Applications
Semiconductor Interfaces, Microstructures and Devices : Properties and Applications
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Author(s): Feng, Zhe Chuan
ISBN No.: 9780750301800
Pages: 308
Year: 199301
Format: Trade Cloth (Hard Cover)
Price: $ 427.86
Status: Out Of Print

Electric field induced localization in superlattices R Tsu Intersubband transitions and quantum well infrared photodetectors K.K. Choi Real time spectroscopic ellipsometry monitoring of semiconductor growth and etching R.W. Collins et al. X-ray reflectivity from heteroepitaxial layers P. Miceli Spontaneous and stimulated emissions from optical microcavity structures H. Yokoyama et al.


Radiative and nonradiative recombination in AlGaAs and GaAsP heterostructures and some features of the corresponding quantum well laser Zh. I. Alferov and D.Z. Garbuzov Far-infrared cyclotron resonance of 2-dimensional electron gas in III-V semiconductor heterostructures M.O. Manasreh Optics in lower dimensional quantum confined II-VI heterostructures A.V.


Nurmikko and R.L. Gunshor Growth and doping of silicon by low temperature molecular beam epitaxy H-J Gossmann and D.J. Eaglesham Point defects and charge traps in the Si/SiO^O2 system and related structures E.H. Poindexter Growth and characterization of silicon carbide polytypes for electronic applications J.A.


Powell et al.BR>Growth and doping of silicon by low temperature molecular beam epitaxy H-J Gossmann and D.J. Eaglesham Point defects and charge traps in the Si/SiO^O2 system and related structures E.H. Poindexter Growth and characterization of silicon carbide polytypes for electronic applications J.A. Powell et al.



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