Thermal-Aware Testing of Digital VLSI Circuits and Systems
Thermal-Aware Testing of Digital VLSI Circuits and Systems
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Author(s): Chattopadhyay, Santanu
ISBN No.: 9780815378822
Pages: 118
Year: 201804
Format: Trade Cloth (Hard Cover)
Price: $ 96.60
Dispatch delay: Dispatched between 7 to 15 days
Status: Available

Santanu Chattopadhyay received BE degree in Computer Science and Technology from Calcutta University ( BE College ), Kolkata, India, in 1990. In 1992 and 1996 he received M.Tech in Computer and Information Technology and PhD in Computer Science and Engineering , respectively, both from the Indian Institute of Technology , Kharagpur , India. He is currently a professor in the Electronics and Electrical Communication Engineering department, Indian Institute of Technology , Kharagpur . His research interests include low-power digital circuit design and test, System-on-Chip testing, Network-on-Chip design and test, logic encryption. He has more than hundred publications in refereed international journals and conferences. He is a co-author of the book Additive Cellular Automata ¿ Theory and Applications published by the IEEE Computer Society Press . He has also co-authored the book titled Network-on-Chip The Next Generation of System-on-Chip Integration published by the CRC Press .


He has written a number of text books, such as, Compiler Design , System Software , Embedded System Design , all published by the PHI Learning , India. He is a senior member of the IEEE and also one of the regional editors (Asia region) of the IET Circuits, Devices and Systems journal.


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