Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology
Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology
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ISBN No.: 9780819451538
Pages: 220
Year: 200402
Format: Trade Paper
Price: $ 96.60
Dispatch delay: Dispatched between 7 to 15 days
Status: Available

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.


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