This volume collects the refereed contributions based on the presentations made at the Seventh Workshop on Advanced Mathematical and Computational Tools in Metrology, a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources. The volume contains articles by world renowned metrologists and mathematicians involved in measurement science and, together with the six previous volumes in this series, constitutes an authoritative source of the mathematical, statistical and software tools necessary in modern metrology.Contents:Modeling Measurement Processes in Complex Systems with Partial Differential Equations: From Heat Conduction to the Heart (M Bär et al.)Mereotopological Approach for Measurement Software (E Benoit & R Dapoigny)Data Evaluation of Key Comparisons Involving Several Artefacts (M G Cox et al.)Box-Cox Transformations and Robust Control Charts in SPC (M I Gomes & F O Figueiredo)Multisensor Data Fusion and Its Application to Decision Making (P S Girão et al.)Generic System Design for Measurement Databases — Applied to Calibrations in Vacuum Metrology, Bio-Signals and a Template System (H Gross et al.)Evaluation of Repeated Measurements from the Viewpoint of Conventional and Bayesian Statistics (I Lira & W Wöger)Detection of Outliers in Interlaboratory Testing (C Perruchet)On Appropriate Methods for the Validation of Metrological Software (D Richter et al.)Data Analysis — A Dialogue with the Data (D S Sivia)Validation of Soft Sensors in Monitoring Ambient Parameters (P Ciarlini et al.
)Evaluation of Standard Uncertainties in Nested Structures (E Filipe)Measurement System Analysis and Statistical Process Control (A B Forbes)Monte Carlo Study on Logical and Statistical Correlation (B Siebert et al.)Some Problems Concerning the Estimate of the Degree of Equivalence in MRA Key Comparisons and of Its Uncertainty (F Pavese)Preparing for a European Research Area Network in Metrology: Where are We Now? (M Kühne et al.)and other papersReadership: Researchers, graduate students, academics and professionals in metrology.