Transmission Electron Microscopy and Diffractometry of Materials
Transmission Electron Microscopy and Diffractometry of Materials
Click to enlarge
Author(s): Fultz, Brent
ISBN No.: 9783540437642
Edition: Revised
Pages: xxi, 748
Year: 200501
Format: Trade Cloth (Hard Cover)
Price: $ 121.22
Status: Out Of Print

"I can warmly recommend this book, which is attractively priced, as an excellent addition for any materials scientist or physicist who wants a good overview of current diffraction and imaging techniques." (John Hutchison in Journal of Microscopy) "I can recommend it as a valuable resource for anyone involved in a higher-level course on materials characterization." (Ray Egerton in Micron) "A wonderful book. A rare combination of depth, practical advice, and problems for every aspect of modern XRD, TEM, and EELS. No materials lab should be without it now that TEM/STEM has become such a crucial tool for nanoscience." (John C. H. Spence, Arizona State University) "I give a lecture course here on Advanced Electron Microscopy and will certainly be recommending this book for my course.


It is a superb book." (Colin Humphries, Cambridge University) "This text offers the most complete pedagogical treatment of scattering theory available in a single source for graduate instruction in contemporary materials characterization. Its integration of photons and electrons, beam lines and electron microscopes, theory and practice, assists students with diverse scientific and technical backgrounds to understand the essence of diffraction, spectrometry and imaging. Highly recommended." (Ronald Gronsky, University of California, Berkeley) From the reviews of the second edition: "Transmission Electron Microscopy and Diffractometry of Materials has only been out since 2001 a? but so well has it sold that B. Fultz and J. Howe have already produced a revised edition, the revisions a??ranging from substantial re-structuring to subtle rewordinga??. a? I must insist that this text represents an enormous amount of work, it is densely filled, well-illustrated and carefully organized.


It should be on a shelf in all electron microscopy laboratories a? ." (Ultramicroscopy, Vol. 99, 2004) "The book by Fultz and Howe, now in its second edition, is part of a programme of advanced texts covering topics of current and emerging interest in physics. a? Each chapter is accompanied by several problems suitable for a written examination. The contents are very comprehensive a? . My impression is that the book will serve as a useful reference work, as well as a core textbook for graduate students." (Professor L. M.


Brown, Contemporary Physics, Vol. 44 (6), 2003) "The main objective of the present book is teaching. a? Each chapter concludes with a number of problems to be solved by students. Furthermore the appendix contains valuable information in the form of tables and graphs, and also practical hints for daily laboratory work, which might be useful for accreditation procedures. The book can be highly recommended a? ." (W. Oesterle, Werkstoffe und Korrosion, Issue 9, 2003).


To be able to view the table of contents for this publication then please subscribe by clicking the button below...
To be able to view the full description for this publication then please subscribe by clicking the button below...